A. M. . Awad, I. H. El-Abbasi, T. Shoala, S. A. Youssef, D. Shaheen, and G. A. E.-A. Amer, “PCR and Nanotechnology Unraveling Detection Problems of the Seed-borne Pathogen Cephalosporium maydis, the Causal Agent of Late Wilt Disease in Maize”, Int J Nanotechnol Allied Sci, vol. 3, no. 1, pp. 30–39, May 2019.